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Buschmann, Veronique (2008):
Structural characterisation of 2D- and 3D-nanostructures by means of High Resolution Electron Microscopy.
Darmstadt: 1998. IV,146 S, Darmstadt, Technische Univ. Darmstadt, TU Darmstadt,
[Ph.D. Thesis]

Buschmann, Veronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1999):
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructures.
85, In: Journal of applied physics, pp. 2119-2123. [Article]

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