Sydlo, Cezary ; Mottet, B. ; Ganis, H. ; Hartnagel, H. L. ; Krozer, V. ; Delage, S. L. ; Cassette, S. ; Chartier, E. ; Floriot, D. (2001)
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Conference or Workshop Item, Bibliographie

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000)
Model for the Decrease in HBT Collector Current under DC Stress based on Recombination Enhanced Defect Reactions.
11th ESREF-Symposium.
Conference or Workshop Item, Bibliographie

Schuessler, M. ; Mottet, B. ; Sydlo, C. ; Krozer, V. ; Hartnagel, H. L. ; Jakoby, Rolf (2000)
Model for the decrease in HBT collector current under DC stress based on recombination enhanced defect reactions.
Conference or Workshop Item, Bibliographie

Grajal, J. ; Lin, C. I. ; Gonzalez, P. ; Krozer, V. (1999)
Optimization of doping profiles in Schottky diodes for millimeter frequency multipliers.
Conference or Workshop Item, Bibliographie

Dehe, A. ; Beilenhoff, K. ; Fricke, A. ; Klingbeil, Harald ; Krozer, V. ; Hartnagel, H. L. (1999)
Microwave measurement.
In: J. G. Webster, editor, The Measurement, Instrumentation and Sensors Handbook, chapter 55.1-55.5. CRC Press, Boca Raton
Article, Bibliographie

Grajal, J. ; Krozer, V. ; Maldonado, F. ; Gonzalez, E. ; Lin, C. I. ; Hartnagel, H. L. (1998)
Tripler circuit design with Schottky varactors.
Conference or Workshop Item, Bibliographie

Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L. (1997)
Application of semiconductor interface modelling to reliability characterisation.
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Gonzalez, P. ; Gismero, J. ; Maldonado, F. ; Lin, C. I. ; Simon, A. ; Hartnagel, H. L. (1997)
Characterization of Schottky diode performance by numerical simulation coupled with harmonic balance.
Conference or Workshop Item, Bibliographie

Lin, Chih-I. ; Krozer, V. ; Grajal, J. ; Simon, A. ; Hartnagel, H. L. (1997)
Schottky varactor diode optimation for frequency multipliers.
Conference or Workshop Item, Bibliographie

Brandt, Michael ; Schüßler, M. ; Krozer, V. ; Grajal, J. ; Hartnagel, H. L. (1997)
Transmission line pulse based reliability investigations of HBTs.
Conference or Workshop Item, Bibliographie

Dehé, Alfons ; Klingbeil, H. ; Krozer, V. ; Fricke, K. ; Beilenhoff, K. ; Hartnagel, H. L.
ed.: Ranson, Richard G. (1996)
GaAs monolithic integrated microwave power sensor in coplanar waveguide technology.
IEEE MTT-S International Microwave Symposium. San Francisco, Calif. (June 17 - 21, 1996)
Conference or Workshop Item, Bibliographie

Schuessler, M. ; Krozer, V. ; Bock, K. H. ; Brandt, M. ; Vecchi, L. ; Losi, R. ; Hartnagel, Hans L. (1996)
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability, 36 (11-12)
doi: 10.1016/0026-2714(96)00226-0
Article, Bibliographie

Fricke, K. ; Krozer, V. ; Schüßler, M. (1996)
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
3rd International High Temperature Electronics Conference. Albuquerque, NM, USA (June 9-14, 1996)
Conference or Workshop Item, Bibliographie

Dehé, A. ; Krozer, V. ; Fricke, K. ; Klingbeil, H. ; Beilenhoff, K. ; Hartnagel, H. L. (1995)
Integrated microwave power sensor.
In: Electronic letters, 31 (25)
doi: 10.1049/el:19951506
Article, Bibliographie

Pantoja, J. M. M. ; Grüb, Andreas ; Krozer, V. ; Franco, J. L. S. (1995)
Accuracy of nonoscillating one-port noise measurements.
In: IEEE Transactions on Instrumentation and Measurement, 44 (4)
doi: 10.1109/19.392870
Article, Bibliographie

Sigurdardottir, Anna ; Krozer, V. ; Hartnagel, H. L. (1995)
Modeling and design of InAs/AlSb-resonant tunneling diodes.
In: Applied physics letters. 67 (1995), No. 22, S. 3313-3315
Article, Bibliographie

Grajal, J. ; Krozer, V. ; Hartnagel, H. L. ; Gismero, J. (1995)
Simulation of the influence of interface states on HBTs.
Conference or Workshop Item, Bibliographie

Grüb, Andreas ; Simon, A. ; Krozer, V. ; Lin, C.-I. ; Shaalan, M. ; Beilenhoff, K. ; Sigurdardottir, A. ; Hartnagel, H. L. (1995)
Terahertz research at TH Darmstadt.
Third International Workshop on Terahertz Electronics. Zermatt, Schweiz (Aug. 30-31, 1995)
Conference or Workshop Item, Bibliographie

Fricke, Klaus ; Krozer, V. ; Hartnagel, L. (1995)
Theromdynamics of microwave devices.
In: Handbook of microwave technology
Book Section, Bibliographie