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Number of items: 20.

Mottet, Bastian (2005)
Zuverlässigkeitsstudien an Höchstfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Technische Universität Darmstadt
Ph.D. Thesis, Primary publication

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. ; Schmidt, L.-P. (2005)
DC and IF-noise performance optimisation of GaAs Schottky diodes for THz applications.
In: Semiconductor science and technology, 20
Article, Bibliographie

Biber, S. ; Cojocari, Oleg ; Rehm, G. ; Mottet, Bastian ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004)
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2)
doi: 10.1109/TIM.2003.820487
Article, Bibliographie

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Hartnagel, Hans L. ; Schmidt, L.-P. (2004)
GaAs Schottky diode fabrication for THz-frequency mixer applications.
Conference or Workshop Item, Bibliographie

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Sydlo, Cezary ; Hartnagel, Hans L. ; Schmidt, L.-P. (2004)
IF-noise improvement of the GaAs Schottky diodes for THz-frequency mixer applications.
Conference or Workshop Item, Bibliographie

Schür, J. ; Biber, S. ; Gumbmann, F. ; Mottet, Bastian ; Cojocari, Oleg ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004)
Micromachined split-block Schottky-diode mixer for 600GHz.
Conference or Workshop Item, Bibliographie

Vicente, C. ; Mattes, M. ; Cervello, A. ; Wolk, D. ; Mottet, Bastian ; Hartnagel, Hans L. ; Mosig, J. ; Raboso, D. (2004)
Multipactor and corona discharge, prediction in rectangular waveguide based microwave components.
Conference or Workshop Item, Bibliographie

Vicente, C. ; Mattes, M. ; Cervello, A. ; Wolk, D. ; Mottet, Bastian ; Hartnagel, Hans L. ; Mosig, J. R. ; Raboso, D. (2004)
Prediction of corona discharge : towards a simulation tool for arbitrary geometries.
Conference or Workshop Item, Bibliographie

Mottet, Bastian (2004)
Zuverlässigkeitsstudien an Hochfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Technische Universität Darmstadt
Ph.D. Thesis, Bibliographie

Mottet, Bastian ; Sydlo, Cezary ; Kögel, Benjamin ; Robillard, Q. de ; Cojocari, Oleg ; Hartnagel, Hans L. (2004)
The impact of process optimisation on planar THz-Schottky device reliability.
Conference or Workshop Item, Bibliographie

Cojocari, Oleg ; Biber, S. ; Rodriguez-Girones Arboli, Manuel ; Mottet, Bastian ; Marchand, L. ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004)
A new structural approach for uniform sub-micrometer anode metallization of planar THz Schottky components.
In: Semiconductor science & technology, 19
Article, Bibliographie

Biber, S. ; Cojocari, Oleg ; Rehm, G. ; Mottet, Bastian ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004)
A novel system for systematic IF noise and DC characterization of THz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2)
doi: 10.1109/TIM.2003.820487
Article, Bibliographie

Biber, S. ; Schmidt, L.-P. ; Cojocari, Oleg ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. (2003)
Systematic quality assessment of Schottky diodes for THz-applications.
Conference or Workshop Item, Bibliographie

Cojocari, Oleg ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Biber, S. ; Schmidt, L.-P. ; Hartnagel, Hans L. (2003)
Whisker-device-based optimisation of fabrication process for planar THz Schottky diode.
Conference or Workshop Item, Bibliographie

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002)
Integrated microwave sensor for cavity-length measurement in machine engineering.
In: IEEE transactions on microwave theory and techniques, 5 (12)
Article, Bibliographie

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002)
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
Conference or Workshop Item, Bibliographie

Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L. (2002)
Process control and failure analysis implementation for THz Schottky-based components.
Conference or Workshop Item, Bibliographie

Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L. (2002)
Process control methods for THz Schottky-based components.
Conference or Workshop Item, Bibliographie

Sydlo, Cezary ; Saglam, Mustafa ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. (2002)
Reliability investigations on HBV using pulsed electrical stress.
In: Microelectronics reliability, 42
Article, Bibliographie

Mottet, Bastian ; Sydlo, Cezary ; Hartnagel, Hans L. (2000)
Pulsed electrical stress techniques for the detection of non-thermal lifetime-problems with semiconductor devices and their IC's.
Conference or Workshop Item, Bibliographie

This list was generated on Sat May 25 01:21:37 2024 CEST.