Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
A novel system for systematic IF noise and DC characterization of THz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2), pp. 581-587. IEEE, ISSN 0018-9456,
DOI: 10.1109/TIM.2003.820487,
[Article]
Official URL: https://ieeexplore.ieee.org/document/1284895
Item Type: | Article |
---|---|
Erschienen: | 2004 |
Creators: | Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. |
Title: | A novel system for systematic IF noise and DC characterization of THz Schottky diodes |
Language: | English |
Journal or Publication Title: | IEEE Transactions on Instrumentation and Measurement |
Journal volume: | 53 |
Number: | 2 |
Publisher: | IEEE |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
Date Deposited: | 19 Nov 2008 16:27 |
DOI: | 10.1109/TIM.2003.820487 |
Official URL: | https://ieeexplore.ieee.org/document/1284895 |
License: | [undefiniert] |
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Suche nach Titel in: | TUfind oder in Google |
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