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Number of items: 20.

Mottet, Bastian (2005):
Zuverlässigkeitsstudien an Höchstfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Darmstadt, Technische Universität, TU Darmstadt, [Online-Edition: urn:nbn:de:tuda-tuprints-5327],
[Ph.D. Thesis]

Cojocari, Oleg and Biber, S. and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Hartnagel, Hans L. and Schmidt, L.-P. (2005):
DC and IF-noise performance optimisation of GaAs Schottky diodes for THz applications.
In: Semiconductor science and technology, pp. 23-32, 20, [Article]

Cojocari, Oleg and Biber, S. and Mottet, Bastian and Hartnagel, Hans L. and Schmidt, L.-P. (2004):
GaAs Schottky diode fabrication for THz-frequency mixer applications.
In: Workshop on Compound Semiconductor Device and Integrated Circuits <28, 2004, Smolenice>: Proceedings WOCSDICE '04 ...- S. 121-122, [Conference or Workshop Item]

Cojocari, Oleg and Biber, S. and Mottet, Bastian and Sydlo, Cezary and Hartnagel, Hans L. and Schmidt, L.-P. (2004):
IF-noise improvement of the GaAs Schottky diodes for THz-frequency mixer applications.
In: Conference proceedings / 12th European Gallium Arsenide and other Compound Semiconductors Application Symposium : Monday 11th & Tuesday 12th October 2004 ; [at European Microwave Week, Amsterdam, 11 - 15 October 2004] / [endorsed by IEEE; Electron Devices, [Conference or Workshop Item]

Schür, J. and Biber, S. and Gumbmann, F. and Mottet, Bastian and Cojocari, Oleg and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
Micromachined split-block Schottky-diode mixer for 600GHz.
M. Thumm ..., ed.- Piscataway, NJ, IEEE Operations Center, In: Conference digest of the 2004 joint 29th International Conference on Infrared and Millimeter Waves and 12th International Conference on Terahertz Electronics : September 27 - October 1, 2004, University of Karlsruhe (TH), Karlsruhe, Germany / [sponsored b, [Conference or Workshop Item]

Vicente, C. and Mattes, M. and Cervello, A. and Wolk, D. and Mottet, Bastian and Hartnagel, Hans L. and Mosig, J. and Raboso, D. (2004):
Multipactor and corona discharge, prediction in rectangular waveguide based microwave components.
In: Filter Workshop : [International Workshop on Microwave Filters ; 13 - 15 September 2004, CNES, Toulouse, France / CNES, Centre National d'Etudes Spatiales. [Organized by CNES in collaboration with ESA].- Toulouse, 2004.-1 CD-ROM., [Conference or Workshop Item]

Vicente, C. and Mattes, M. and Cervello, A. and Wolk, D. and Mottet, Bastian and Hartnagel, Hans L. and Mosig, J. R. and Raboso, D. (2004):
Prediction of corona discharge : towards a simulation tool for arbitrary geometries.
In: JINA Symposium <2004, Nice>: Proceedings ... 8.-11.11.2004, [Conference or Workshop Item]

Mottet, Bastian (2004):
Zuverlässigkeitsstudien an Hochfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Darmstadt, Techn. Univ., TU Darmstadt, [Ph.D. Thesis]

Mottet, Bastian and Sydlo, Cezary and Kögel, Benjamin and Robillard, Q. de and Cojocari, Oleg and Hartnagel, Hans L. (2004):
The impact of process optimisation on planar THz-Schottky device reliability.
Piscataway, NJ, IEEE Service Center, In: 2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual ; Phoenix, Arizona, April 25 - 29, 2004 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.- Piscataway, NJ : IEEE Service Center, 2004.- XII, 7, [Conference or Workshop Item]

Cojocari, Oleg and Biber, S. and Rodriguez-Girones Arboli, Manuel and Mottet, Bastian and Marchand, L. and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
A new structural approach for uniform sub-micrometer anode metallization of planar THz Schottky components.
In: Semiconductor science & technology, pp. 537-542, 19, [Article]

Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
A novel system for systematic microwave noise and DC characterization of THz Schottky diodes.
In: IEEE transactions on instrumentation and measurement, pp. 581-587, Vol. 5, [Article]

Biber, S. and Schmidt, L.-P. and Cojocari, Oleg and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Hartnagel, Hans L. (2003):
Systematic quality assessment of Schottky diodes for THz-applications.
Noordwijk, ESA Publ. Div., In: Workshop on Millimetre Wave Technology and Applications <3, 2003, Espoo>: Proceedings ...21-23 May 2003, Millilab, Espoo, Finland / ed. Juha Mallat.- Noordwijk: ESA Publ. Div., 2003.- 682 S.- (ESA WPP ; 212).- S. 237-242, [Conference or Workshop Item]

Cojocari, Oleg and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Biber, S. and Schmidt, L.-P. and Hartnagel, Hans L. (2003):
Whisker-device-based optimisation of fabrication process for planar THz Schottky diode.
Noordwijk, ESA Publ. Div., In: Workshop on Millimetre Wave Technology and Applications <3, 2003, Espoo>: Proceedings ...21-23 May 2003, Millilab, Espoo, Finland / ed. Juha Mallat.- Noordwijk: ESA Publ. Div., 2003.- 682 S.- (ESA WPP ; 212).- S. 255-260, [Conference or Workshop Item]

Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. (2003):
A novel system for systematic IF noise and DC characterization of THz Schottky diodes.
In: IEEE transactions on instrumentation and measurement, [Other]

Megej, Alexander and Beilenhoff, Klaus and Schüßler, Martin and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement in machine engineering.
In: IEEE transactions on microwave theory and techniques, Institute of Electrical and Electronics Engineers (IEEE), pp. 3070-3076, 5, (12), ISSN 1557-9670,
[Article]

Megej, Alexander and Beilenhoff, Klaus and Schüßler, Martin and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
Piscataway, NJ, IEEE Service Center, In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, [Conference or Workshop Item]

Ichizli, Victoria M. and Rodriguez-Girones Arboli, Manuel and Marchand, L. and Garden, C. and Cojocari, Oleg and Mottet, Bastian and Hartnagel, Hans L. (2002):
Process control and failure analysis implementation for THz Schottky-based components.
Oxford, Pergamon Pr., In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Reliability of electron devices, failure physics and analysis / guest ed.: Fausto Fantini ...- Oxford: Pergamon Pr., 2002, [Conference or Workshop Item]

Ichizli, Victoria M. and Rodriguez-Girones Arboli, Manuel and Marchand, L. and Garden, C. and Cojocari, Oleg and Mottet, Bastian and Hartnagel, Hans L. (2002):
Process control methods for THz Schottky-based components.
Noordwijk, ESA Publ. Div., In: European Space Components Conference <2002, Toulouse>: Proceedings ... ESCCON 2002 .../ comp. by Robert A. Harris.- Noordwijk: ESA Publ. Div., 2002.- ISBN 92-9092-817-4, [Conference or Workshop Item]

Sydlo, Cezary and Saglam, Mustafa and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Hartnagel, Hans L. (2002):
Reliability investigations on HBV using pulsed electrical stress.
In: Microelectronics reliability, pp. 1563-1568, 42, [Article]

Mottet, Bastian and Sydlo, Cezary and Hartnagel, Hans L. (2000):
Pulsed electrical stress techniques for the detection of non-thermal lifetime-problems with semiconductor devices and their IC's.
In: GAAS 2000: Gallium Arsenide and other Semiconductor Application Symposium <2000, Paris>; Symposium Proceedings. S. 39-43, [Conference or Workshop Item]

This list was generated on Tue Jul 16 01:17:25 2019 CEST.