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Number of items: 20.

Mottet, Bastian (2005):
Zuverlässigkeitsstudien an Höchstfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Darmstadt, Technische Universität, TU Darmstadt,
[Ph.D. Thesis]

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. ; Schmidt, L.-P. (2005):
DC and IF-noise performance optimisation of GaAs Schottky diodes for THz applications.
In: Semiconductor science and technology, 20, pp. 23-32. [Article]

Biber, S. ; Cojocari, Oleg ; Rehm, G. ; Mottet, Bastian ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004):
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2), pp. 581-587. IEEE, ISSN 0018-9456,
DOI: 10.1109/TIM.2003.820487,
[Article]

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Hartnagel, Hans L. ; Schmidt, L.-P. (2004):
GaAs Schottky diode fabrication for THz-frequency mixer applications.
In: Workshop on Compound Semiconductor Device and Integrated Circuits <28, 2004, Smolenice>: Proceedings WOCSDICE '04 ...- S. 121-122, [Conference or Workshop Item]

Cojocari, Oleg ; Biber, S. ; Mottet, Bastian ; Sydlo, Cezary ; Hartnagel, Hans L. ; Schmidt, L.-P. (2004):
IF-noise improvement of the GaAs Schottky diodes for THz-frequency mixer applications.
In: Conference proceedings / 12th European Gallium Arsenide and other Compound Semiconductors Application Symposium : Monday 11th & Tuesday 12th October 2004 ; [at European Microwave Week, Amsterdam, 11 - 15 October 2004] / [endorsed by IEEE; Electron Devices, [Conference or Workshop Item]

Schür, J. ; Biber, S. ; Gumbmann, F. ; Mottet, Bastian ; Cojocari, Oleg ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004):
Micromachined split-block Schottky-diode mixer for 600GHz.
In: Conference digest of the 2004 joint 29th International Conference on Infrared and Millimeter Waves and 12th International Conference on Terahertz Electronics : September 27 - October 1, 2004, University of Karlsruhe (TH), Karlsruhe, Germany / [sponsored b, M. Thumm ..., ed.- Piscataway, NJ, IEEE Operations Center, [Conference or Workshop Item]

Vicente, C. ; Mattes, M. ; Cervello, A. ; Wolk, D. ; Mottet, Bastian ; Hartnagel, Hans L. ; Mosig, J. ; Raboso, D. (2004):
Multipactor and corona discharge, prediction in rectangular waveguide based microwave components.
In: Filter Workshop : [International Workshop on Microwave Filters ; 13 - 15 September 2004, CNES, Toulouse, France / CNES, Centre National d'Etudes Spatiales. [Organized by CNES in collaboration with ESA].- Toulouse, 2004.-1 CD-ROM., [Conference or Workshop Item]

Vicente, C. ; Mattes, M. ; Cervello, A. ; Wolk, D. ; Mottet, Bastian ; Hartnagel, Hans L. ; Mosig, J. R. ; Raboso, D. (2004):
Prediction of corona discharge : towards a simulation tool for arbitrary geometries.
In: JINA Symposium <2004, Nice>: Proceedings ... 8.-11.11.2004, p. 27, [Conference or Workshop Item]

Mottet, Bastian (2004):
Zuverlässigkeitsstudien an Hochfrequenzbauelementen mit gepulsten Techniken (TLP-Methode).
Darmstadt, Techn. Univ., TU Darmstadt,
[Ph.D. Thesis]

Mottet, Bastian ; Sydlo, Cezary ; Kögel, Benjamin ; Robillard, Q. de ; Cojocari, Oleg ; Hartnagel, Hans L. (2004):
The impact of process optimisation on planar THz-Schottky device reliability.
In: 2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual ; Phoenix, Arizona, April 25 - 29, 2004 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.- Piscataway, NJ : IEEE Service Center, 2004.- XII, 7, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

Cojocari, Oleg ; Biber, S. ; Rodriguez-Girones Arboli, Manuel ; Mottet, Bastian ; Marchand, L. ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004):
A new structural approach for uniform sub-micrometer anode metallization of planar THz Schottky components.
In: Semiconductor science & technology, 19, pp. 537-542. [Article]

Biber, S. ; Cojocari, Oleg ; Rehm, G. ; Mottet, Bastian ; Schmidt, L.-P. ; Hartnagel, Hans L. (2004):
A novel system for systematic IF noise and DC characterization of THz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2), pp. 581-587. IEEE, ISSN 0018-9456,
DOI: 10.1109/TIM.2003.820487,
[Article]

Biber, S. ; Schmidt, L.-P. ; Cojocari, Oleg ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. (2003):
Systematic quality assessment of Schottky diodes for THz-applications.
In: Workshop on Millimetre Wave Technology and Applications <3, 2003, Espoo>: Proceedings ...21-23 May 2003, Millilab, Espoo, Finland / ed. Juha Mallat.- Noordwijk: ESA Publ. Div., 2003.- 682 S.- (ESA WPP ; 212).- S. 237-242, Noordwijk, ESA Publ. Div., [Conference or Workshop Item]

Cojocari, Oleg ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Biber, S. ; Schmidt, L.-P. ; Hartnagel, Hans L. (2003):
Whisker-device-based optimisation of fabrication process for planar THz Schottky diode.
In: Workshop on Millimetre Wave Technology and Applications <3, 2003, Espoo>: Proceedings ...21-23 May 2003, Millilab, Espoo, Finland / ed. Juha Mallat.- Noordwijk: ESA Publ. Div., 2003.- 682 S.- (ESA WPP ; 212).- S. 255-260, Noordwijk, ESA Publ. Div., [Conference or Workshop Item]

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement in machine engineering.
5, In: IEEE transactions on microwave theory and techniques, (12), pp. 3070-3076. Institute of Electrical and Electronics Engineers (IEEE), ISSN 1557-9670,
[Article]

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L. (2002):
Process control and failure analysis implementation for THz Schottky-based components.
In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Reliability of electron devices, failure physics and analysis / guest ed.: Fausto Fantini ...- Oxford: Pergamon Pr., 2002, Oxford, Pergamon Pr., [Conference or Workshop Item]

Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L. (2002):
Process control methods for THz Schottky-based components.
In: European Space Components Conference <2002, Toulouse>: Proceedings ... ESCCON 2002 .../ comp. by Robert A. Harris.- Noordwijk: ESA Publ. Div., 2002.- ISBN 92-9092-817-4, Noordwijk, ESA Publ. Div., [Conference or Workshop Item]

Sydlo, Cezary ; Saglam, Mustafa ; Mottet, Bastian ; Rodriguez-Girones Arboli, Manuel ; Hartnagel, Hans L. (2002):
Reliability investigations on HBV using pulsed electrical stress.
In: Microelectronics reliability, 42, pp. 1563-1568. [Article]

Mottet, Bastian ; Sydlo, Cezary ; Hartnagel, Hans L. (2000):
Pulsed electrical stress techniques for the detection of non-thermal lifetime-problems with semiconductor devices and their IC's.
In: GAAS 2000: Gallium Arsenide and other Semiconductor Application Symposium <2000, Paris>; Symposium Proceedings. S. 39-43, [Conference or Workshop Item]

This list was generated on Tue Jan 18 01:05:34 2022 CET.