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Megej, Alexander ; Beilenhoff, Klaus ; Schüßler, Martin ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. :
Integrated microwave sensor for cavity-length measurement in machine engineering.
In: IEEE transactions on microwave theory and techniques, 5 (12) S. 3070-3076. ISSN 1557-9670
[Artikel] , (2002)

Megej, Alexander ; Beilenhoff, Klaus ; Schüßler, Martin ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. :
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646 . IEEE Service Center , Piscataway, NJ
[Konferenz- oder Workshop-Beitrag] , (2002)