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Reliability investigations on HBV using pulsed electrical stress

Sydlo, Cezary and Saglam, Mustafa and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Hartnagel, Hans L. (2002):
Reliability investigations on HBV using pulsed electrical stress.
In: Microelectronics reliability, 42, pp. 1563-1568. [Article]

Item Type: Article
Erschienen: 2002
Creators: Sydlo, Cezary and Saglam, Mustafa and Mottet, Bastian and Rodriguez-Girones Arboli, Manuel and Hartnagel, Hans L.
Title: Reliability investigations on HBV using pulsed electrical stress
Language: English
Journal or Publication Title: Microelectronics reliability
Journal volume: 42
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:30
Additional Information:

Ebenfalls ersch. in: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Proceedings

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