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Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy

Megej, Alexander and Beilenhoff, Klaus and Schuessler, M. and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2002
Creators: Megej, Alexander and Beilenhoff, Klaus and Schuessler, M. and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L.
Title: Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy
Language: English
Series Name: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646
Place of Publication: Piscataway, NJ
Publisher: IEEE Service Center
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:30
License: [undefiniert]
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