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Process control and failure analysis implementation for THz Schottky-based components

Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L. (2002):
Process control and failure analysis implementation for THz Schottky-based components.
In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Reliability of electron devices, failure physics and analysis / guest ed.: Fausto Fantini ...- Oxford: Pergamon Pr., 2002, Oxford, Pergamon Pr., [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2002
Creators: Ichizli, Victoria M. ; Rodriguez-Girones Arboli, Manuel ; Marchand, L. ; Garden, C. ; Cojocari, Oleg ; Mottet, Bastian ; Hartnagel, Hans L.
Title: Process control and failure analysis implementation for THz Schottky-based components
Language: English
Series Name: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis <13, 2002, Bellaria>: Reliability of electron devices, failure physics and analysis / guest ed.: Fausto Fantini ...- Oxford: Pergamon Pr., 2002
Place of Publication: Oxford
Publisher: Pergamon Pr.
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:30
License: [undefiniert]
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