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Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement in machine engineering.
5, In: IEEE transactions on microwave theory and techniques, (12), pp. 3070-3076. Institute of Electrical and Electronics Engineers (IEEE), ISSN 1557-9670,
[Article]

Megej, Alexander ; Beilenhoff, Klaus ; Schuessler, M. ; Ziroff, A. ; Mottet, Bastian ; Yilmazoglu, Oktay ; Mutamba, Kabula ; Hamann, C. D. ; Baican, R. ; Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

This list was generated on Tue Oct 26 02:26:15 2021 CEST.