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Number of items: 2.

Megej, Alexander and Beilenhoff, Klaus and Schüßler, Martin and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement in machine engineering.
In: IEEE transactions on microwave theory and techniques, Institute of Electrical and Electronics Engineers (IEEE), pp. 3070-3076, 5, (12), ISSN 1557-9670,
[Article]

Megej, Alexander and Beilenhoff, Klaus and Schüßler, Martin and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
Piscataway, NJ, IEEE Service Center, In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, [Conference or Workshop Item]

This list was generated on Tue Jul 23 01:41:01 2019 CEST.