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Number of items: 2.

Megej, Alexander and Beilenhoff, Klaus and Schuessler, M. and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement in machine engineering.
5, In: IEEE transactions on microwave theory and techniques, (12), Institute of Electrical and Electronics Engineers (IEEE), pp. 3070-3076, ISSN 1557-9670, [Article]

Megej, Alexander and Beilenhoff, Klaus and Schuessler, M. and Ziroff, A. and Mottet, Bastian and Yilmazoglu, Oktay and Mutamba, Kabula and Hamann, C. D. and Baican, R. and Hartnagel, Hans L. (2002):
Integrated microwave sensor for cavity-length measurement with sub-millimeter accuracy.
In: IEEE MTT S International Microwave Symposium digest 2002 ; vol. 2 / ed. Rob Hamilton.- Piscataway, NJ: IEEE Service Center, 2002.- ISBN 0-7803-7239-5.- S. 643-646, Piscataway, NJ, IEEE Service Center, [Conference or Workshop Item]

This list was generated on Sat Feb 15 00:18:37 2020 CET.