Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2), pp. 581-587. IEEE, ISSN 0018-9456,
DOI: 10.1109/TIM.2003.820487,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2004 |
| Creators: | Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. |
| Title: | A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes |
| Language: | English |
| Journal or Publication Title: | IEEE Transactions on Instrumentation and Measurement |
| Journal volume: | 53 |
| Number: | 2 |
| Publisher: | IEEE |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 20 Nov 2008 08:21 |
| DOI: | 10.1109/TIM.2003.820487 |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
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