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A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes

Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L. (2004):
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes.
In: IEEE Transactions on Instrumentation and Measurement, 53 (2), pp. 581-587. IEEE, ISSN 0018-9456,
DOI: 10.1109/TIM.2003.820487,
[Article]

Item Type: Article
Erschienen: 2004
Creators: Biber, S. and Cojocari, Oleg and Rehm, G. and Mottet, Bastian and Schmidt, L.-P. and Hartnagel, Hans L.
Title: A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes
Language: English
Journal or Publication Title: IEEE Transactions on Instrumentation and Measurement
Journal volume: 53
Number: 2
Publisher: IEEE
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 20 Nov 2008 08:21
DOI: 10.1109/TIM.2003.820487
License: [undefiniert]
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