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Number of items: 7.

Rodenbücher, C. ; Hildebrandt, E. ; Szot, K. ; Sharath, S. U. ; Kurian, J. ; Komissinskiy, P. ; Breuer, U. ; Waser, R. ; Alff, L. (2016)
Hafnium carbide formation in oxygen deficient hafnium oxide thin films.
In: Applied Physics Letters, 108 (25)
doi: 10.1063/1.4954714
Article, Bibliographie

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (2000)
Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements.
In: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds
Article, Bibliographie

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (1999)
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
Conference or Workshop Item, Bibliographie

Breuer, U. ; Holzbrecher, H. ; Gastel, M. ; Becker, J. S. ; Dietze, H.-J. (1997)
Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment.
In: Fresenius Journal of Analytical Chemistry, 358
doi: 10.1007/s002160050342
Article, Bibliographie

Breuer, U. ; Holzbrecher, H. ; Gastel, M. ; Becker, J. S. ; Dietze, H.-J.
ed.: Benninghoven, A. (1997)
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
International Conference on Secondary Ion Mass Spectrometry (SIMS X). Muenster (October 1-6, 1995)
Conference or Workshop Item, Bibliographie

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997)
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210
Article, Bibliographie

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997)
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
Conference or Workshop Item, Bibliographie

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