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Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements

Gastel, Michael and Flege, Stefan and Breuer, U. and Ortner, H. M. (1999):
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
In: International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408, Amsterdam, Elsevier, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1999
Creators: Gastel, Michael and Flege, Stefan and Breuer, U. and Ortner, H. M.
Title: Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements
Language: English
Series Name: International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408
Place of Publication: Amsterdam
Publisher: Elsevier
Divisions: 11 Department of Materials and Earth Sciences
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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