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Number of items: 7.

Krajnikov, Alexander V. ; Gastel, Michael ; Ortner, Hugo M. (2002):
Surface Characterisation of Water-Atomised Al-Zn-Mg-Cu Alloy Powders by SIMS and AES.
In: Microchimica Acta, 138 (1), pp. 1-12. [Article]

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (2000):
Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements.
In: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds, pp. 405-408. Elsevier, [Article]

Gastel, Michael ; Konetschny, Christoph ; Reuter, Ulrich ; Fasel, Claudia ; Schulz, Herbert ; Riedel, Ralf ; Ortner, Hugo M. (2000):
Investigation of the wear mechanism of cubic boron nitride tools used for the machining of compacted graphite iron and grey cast iron.
In: Journal of Refractory Metals and Hard Materials, 18 (6), pp. 287-296. Elsevier, ISSN 0263-4368; 0958-0611,
DOI: 10.1016/S0263-4368(00)00032-9,
[Article]

Gastel, Michael ; Reuter, Ulrich ; Schulz, Herbert ; Ortner, H. M. (1999):
SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron.
In: Fresenius Journal of Analytical Chemistry, 365 (1-3), pp. 142-146. Springer, ISSN 0937-0633,
DOI: 10.1007/s002160051460,
[Article]

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (1999):
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
In: International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408, Amsterdam, Elsevier, [Conference or Workshop Item]

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210, [Article]

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, Chichester, Wiley, [Conference or Workshop Item]

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