Krajnikov, Alexander V. ; Gastel, Michael ; Ortner, Hugo M. (2002)
Surface Characterisation of Water-Atomised Al-Zn-Mg-Cu Alloy Powders by SIMS and AES.
In: Microchimica Acta, 138 (1)
Artikel, Bibliographie

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (2000)
Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements.
In: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds
Artikel, Bibliographie

Gastel, Michael ; Konetschny, Christoph ; Reuter, Ulrich ; Fasel, Claudia ; Schulz, Herbert ; Riedel, Ralf ; Ortner, Hugo M. (2000)
Investigation of the wear mechanism of cubic boron nitride tools used for the machining of compacted graphite iron and grey cast iron.
In: Journal of Refractory Metals and Hard Materials, 18 (6)
doi: 10.1016/S0263-4368(00)00032-9
Artikel, Bibliographie

Gastel, Michael ; Reuter, Ulrich ; Schulz, Herbert ; Ortner, H. M. (1999)
SIMS Analysis of the wear of boron nitride tools for the machining of compacted graphite iron and grey cast iron.
In: Fresenius Journal of Analytical Chemistry, 365 (1-3)
doi: 10.1007/s002160051460
Artikel, Bibliographie

Gastel, Michael ; Flege, Stefan ; Breuer, U. ; Ortner, H. M. (1999)
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
Konferenzveröffentlichung, Bibliographie

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997)
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210
Artikel, Bibliographie

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997)
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
Konferenzveröffentlichung, Bibliographie