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Depth profile analysis of thin film solar cells using SNMS and SIMS

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210, [Article]

Item Type: Article
Erschienen: 1997
Creators: Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H.
Title: Depth profile analysis of thin film solar cells using SNMS and SIMS
Language: English
Journal or Publication Title: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
Date Deposited: 19 Nov 2008 16:23
License: [undefiniert]
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