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Number of items: 7.

Rodenbücher, C. and Hildebrandt, E. and Szot, K. and Sharath, S. U. and Kurian, J. and Komissinskiy, P. and Breuer, U. and Waser, R. and Alff, L. (2016):
Hafnium carbide formation in oxygen deficient hafnium oxide thin films.
In: Applied Physics Letters, AIP Publishing, p. 252903, 108, (25), ISSN 0003-6951,
[Online-Edition: http://doi.org/10.1063/1.4954714],
[Article]

Gastel, Michael and Flege, Stefan and Breuer, U. and Ortner, H. M. (2000):
Generalization of the „Correlation Plot“-Method for Standard-Free Quantification of SIMS- and SNMS-Measurements for Samples Containing Three or More Elements.
In: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry, Brussels, Sept. 1999, A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner, eds, Elsevier, pp. 405-408, [Article]

Gastel, Michael and Flege, Stefan and Breuer, U. and Ortner, H. M. (1999):
Generalisation of the 'correlation plot' method for standard-free quantification of SIMS and SNMS measurements for samples containing three or more elements.
Amsterdam, Elsevier, In: International Conference on Secondary Ion Mass Spectrometry <11, 1999, Brussels>: Proceedings. Hrsg.: A. Benninghoven (u.a.). - Amsterdam: Elsevier, 2000. S. 405-408, [Conference or Workshop Item]

Breuer, U. and Holzbrecher, and Gastel, and Becker, and Dietze, (1997):
Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 47-50, [Article]

Breuer, U. and Holzbrecher, and Gastel, and Becker, and Dietze, (1997):
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
Chicheter, Wiley, In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 391-394, [Conference or Workshop Item]

Gastel, Michael and Breuer, U. and Holzbrecher, H. and Becker, J. S. and Dietze, H.-J. and Wagner, H. (1997):
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210, [Article]

Gastel, Michael and Breuer, U. and Holzbrecher, H. and Kubon, M. and Becker, J. S. and Dietze, H.-J. and Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
Chichester, Wiley, In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, [Conference or Workshop Item]

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