Hirzel, S. and Plötz, P. and Rohde, C. and Teufel, B. and Krassowski, J. and Beier, C. and Rauscher, T. and Frick, J. and Schreiner, M. and Wagner, H. and Flamme, S. and Pöstges, A. and Oppermann, L. and Heiwolt, K. and Ruland, R. and Sikorski, L. and Seier, M and Frietsch, O. and Koch, T. (2017):
What’s going on in energy efficiency research? A platform to enhance the transparency of energy research funding in Germany.
In: ECEEE Summer Study Proceedings, pp. 501-506, [Article]

Gastel, Michael and Breuer, U. and Holzbrecher, H. and Becker, J. S. and Dietze, H.-J. and Wagner, H. (1997):
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210, [Article]

Gastel, Michael and Breuer, U. and Holzbrecher, H. and Kubon, M. and Becker, J. S. and Dietze, H.-J. and Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
Chichester, Wiley, In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, [Conference or Workshop Item]