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Hirzel, S. ; Plötz, P. ; Rohde, C. ; Teufel, B. ; Krassowski, J. ; Beier, C. ; Rauscher, T. ; Frick, J. ; Schreiner, M. ; Wagner, H. ; Flamme, S. ; Pöstges, A. ; Oppermann, L. ; Heiwolt, K. ; Ruland, R. ; Sikorski, L. ; Seier, M. ; Frietsch, O. ; Koch, T. (2017):
What’s going on in energy efficiency research? A platform to enhance the transparency of energy research funding
in Germany.
In: ECEEE Summer Study Proceedings, pp. 501-506. [Article]
Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Depth profile analysis of thin film solar cells using SNMS and SIMS.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 207-210, [Article]
Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, Chichester, Wiley, [Conference or Workshop Item]