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Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS

Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, Chichester, Wiley, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H.
Title: Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS
Language: English
Series Name: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997
Place of Publication: Chichester
Publisher: Wiley
Divisions: 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
11 Department of Materials and Earth Sciences
Date Deposited: 19 Nov 2008 16:23
License: [undefiniert]
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