Dehé, Alfons ; Peerlings, J. ; Pfeiffer, J. ; Riemenschneider, R. ; Vogt, A. ; Streubel, K. ; Künzel, H. ; Meißner, P. ; Hartnagel, H. L. (1998)
III-V Compound semiconductor micromachined actuators for long resonator tunable Fabry-Pérot detectors.
In: Sensors and Actuators A : Physical, 68 (1-3)
doi: 10.1016/S0924-4247(98)00071-5
Artikel, Bibliographie

Brandt, Michael ; Bachmann, V. ; Vogt, A. ; Fach, M. ; Mayer, K. ; Breuer, B. ; Hartnagel, H. L. (1998)
Highly sensitive AlGaAs/GaAs position sensors for measurement of tyre tread deformation.
In: Electronics Letters, 34 (8)
doi: 10.1049/el:19980520
Artikel, Bibliographie

Hartnagel, Hans L. ; Arslan, D. ; Brandt, M. ; Dehé, A. ; Mutamba, K. ; Vogt, A. (1998)
Compound semiconductor microsensors for applications in mechanical engineering.
Gallium Arsenide Applications Symposium. GAAS'98. Amsterdam, Nederlands (5-6 October 1998)
Konferenzveröffentlichung, Bibliographie

Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Konferenzveröffentlichung, Bibliographie

Vogt, A. ; Brandt, M. ; Sigurdardottir, A. ; Schüssler, M. ; Pena, D. ; Simon, A. ; Hartnagel, H. L. ; Rodewald, M. ; Roesner, M. ; Fuess, H. ; Goswami, S. N. N. ; Lal, K. (1997)
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00141-8
Artikel, Bibliographie

Liberis, J. ; Matulionis, A. ; Sakalas, P. ; Saltis, R. ; Dozsa, L. ; Szentpali, B. ; Tuyen, V. van ; Hartnagel, H. L. ; Mutamba, K. ; Sigurdardottir, A. ; Vogt, A. (1997)
Microwave noise in unipolar diodes with nanometric barriers.
International Conference on Noise in Physical Systems and 1/f Fluctuations. Leuven (14.-18. July 1997)
Konferenzveröffentlichung, Bibliographie

Horn, J. ; Vogt, A. ; Aller, I. ; Hartnagel, H. L. ; Stehle, M. (1996)
Heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of Vacuum Science and Technology B, 14 (2)
doi: 10.1116/1.588721
Artikel, Bibliographie