Kocheva, D. ; Rainovski, G. ; Jolie, J. ; Pietralla, N. ; Blazhev, A. ; Astier, A. ; Altenkirch, R. ; Bast, M. ; Beckers, M. ; Ansari, S. ; Braunroth, Th. ; Cappellazzo, M. ; Cortés, M. L. ; Dewald, A. ; Diel, F. ; Djongolov, M. ; Fransen, C. ; Gladnishki, K. ; Goldkuhle, A. ; Hennig, A. ; Karayonchev, V. ; Keatings, J. M. ; Kluge, E. ; Kröll, Th. ; Litzinger, J. ; Moschner, K. ; Müller-Gatermann, C. ; Petkov, P. ; Rudigier, M. ; Scheck, M. ; Spagnoletti, P. ; Scholz, Ph. ; Schmidt, T. ; Spieker, M. ; Stahl, C. ; Stegmann, R. ; Stolz, A. ; Vogt, A. ; Stoyanova, M. ; Thöle, P. ; Warr, N. ; Werner, V. ; Witt, W. ; Wölk, D. ; Zamora, J.C. ; Zell, K.O. ; Van Isacker, P. ; Ponomarev, V. Yu. (2018)
Low collectivity of the first 2⁺ states of ²¹²,²¹⁰Po.
In: Journal of Physics: Conference Series, 1023 (1)
doi: 10.1088/1742-6596/1023/1/012019
Article, Bibliographie

Dehé, Alfons ; Peerlings, J. ; Pfeiffer, J. ; Riemenschneider, R. ; Vogt, A. ; Streubel, K. ; Künzel, H. ; Meißner, P. ; Hartnagel, H. L. (1998)
III-V Compound semiconductor micromachined actuators for long resonator tunable Fabry-Pérot detectors.
In: Sensors and Actuators A : Physical, 68 (1-3)
doi: 10.1016/S0924-4247(98)00071-5
Article, Bibliographie

Brandt, Michael ; Bachmann, V. ; Vogt, A. ; Fach, M. ; Mayer, K. ; Breuer, B. ; Hartnagel, H. L. (1998)
Highly sensitive AlGaAs/GaAs position sensors for measurement of tyre tread deformation.
In: Electronics Letters, 34 (8)
doi: 10.1049/el:19980520
Article, Bibliographie

Hartnagel, Hans L. ; Arslan, D. ; Brandt, M. ; Dehé, A. ; Mutamba, K. ; Vogt, A. (1998)
Compound semiconductor microsensors for applications in mechanical engineering.
Gallium Arsenide Applications Symposium. GAAS'98. Amsterdam, Nederlands (05.10.1998-06.10.1998)
Conference or Workshop Item, Bibliographie

Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Conference or Workshop Item, Bibliographie

Vogt, A. ; Brandt, M. ; Sigurdardottir, A. ; Schüssler, M. ; Pena, D. ; Simon, A. ; Hartnagel, H. L. ; Rodewald, M. ; Roesner, M. ; Fuess, H. ; Goswami, S. N. N. ; Lal, K. (1997)
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00141-8
Article, Bibliographie

Liberis, J. ; Matulionis, A. ; Sakalas, P. ; Saltis, R. ; Dozsa, L. ; Szentpali, B. ; Tuyen, V. van ; Hartnagel, H. L. ; Mutamba, K. ; Sigurdardottir, A. ; Vogt, A. (1997)
Microwave noise in unipolar diodes with nanometric barriers.
International Conference on Noise in Physical Systems and 1/f Fluctuations. Leuven (14.07.1997-18.07.1997)
Conference or Workshop Item, Bibliographie

Horn, J. ; Vogt, A. ; Aller, I. ; Hartnagel, H. L. ; Stehle, M. (1996)
Heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of Vacuum Science and Technology B, 14 (2)
doi: 10.1116/1.588721
Article, Bibliographie