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Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence

Horn, Joachim and Vogt, and Aller, and Hartnagel, (1996):
Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of vacuum science and technology. B 14 (1996), S. 820-823, [Article]

Item Type: Article
Erschienen: 1996
Creators: Horn, Joachim and Vogt, and Aller, and Hartnagel,
Title: Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence
Language: German
Journal or Publication Title: Journal of vacuum science and technology. B 14 (1996), S. 820-823
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
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