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Number of items: 3.

Piros, Eszter and Lonsky, Martin and Petzold, Stefan and Zintler, Alexander and Sharath, S.U. and Vogel, Tobias and Kaiser, Nico and Eilhardt, Robert and Molina-Luna, Leopoldo and Wenger, Christian and Müller, Jens and Alff, Lambert (2020):
Role of Oxygen Defects in Conductive-Filament Formation in Y2O3 -Based Analog RRAM Devices as Revealed by Fluctuation Spectroscopy.
In: Physical Review Applied, 14 (3), pp. 034029. American Physical Society, ISSN 2331-7019,
DOI: 10.1103/PhysRevApplied.14.034029,
[Article]

Piros, Eszter and Lonsky, Martin and Petzold, Martin and Zintler, Alexander and Sharath, S.U. and Vogel, Tobias and Kaiser, Nico and Eilhardt, Robert and Molina-Luna, Leopoldo and Wenger, Christian and Müller, Jens and Alff, Lambert (2020):
Role of oxygen defects in forming conductive filaments in Y2O3-based analog RRAM devices as revealed by fluctuation spectroscopy.
In: Physical Review Applied, APS Publishing, ISSN 2331-7019,
[Article]

Petzold, S. and Miranda, E. and Sharath, S.U. and Munos-Gorriz, J. and Vogel, T. and Piros, E. and Kaiser, N. and Eilhardt, Robert and Zintler, Alexander and Molina-Luna, Leopoldo and Sune, J. and Alff, Lambert (2019):
Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
In: Journal of Applied Physics, (125), p. 234503. ISSN 00218979,
DOI: 10.1063/1.5094864,
[Article]

This list was generated on Tue Jun 15 01:52:38 2021 CEST.