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Number of items: 15.

Ichizli, Victoria M. ; Riemenschneider, R. ; Hartnagel, H. L. (2000)
Scanning tunneling spectroscopy characterisation of As+ implanted InP (100) single crystals.
In: Journal of Vacuum Science and Technology B, 18 (5)
doi: 10.1116/1.1288202
Article, Bibliographie

Peerlings, Joachim ; Riemenschneider, R. ; Naveen Kumar, V. ; Strassner, M. ; Pfeiffer, J. ; Scheuer, V. ; Daleiden, J. ; Mutamba, K. ; Herbst, S. (1999)
Two-chip InGaAs-InP Fabry-Pérot p-i-n receiver for WDM systems.
In: IEEE Photonics technology letters, 11 (2)
doi: 10.1109/68.740723
Article, Bibliographie

Hartnagel, Hans L. ; Pfeiffer, J. ; Mutamba, K. ; Peerlings, J. ; Riemenschneider, R. ; Meißner, P. (1999)
III-V Membrane structures for tunable Fabry-Pérot filters and sensor applications.
Conference or Workshop Item, Bibliographie

Hartnagel, Hans L. ; Mutamba, K. ; Brandt, M. ; Pfeiffer, J. ; Riemenschneider, R. ; Meißner, P. ; Breuer, B. ; Hennecke, Dietmar K. ; Stoffel, B. (1999)
III-V-Micromechanics for sensing applications in mechanical engineering and for optical communications.
Conference or Workshop Item, Bibliographie

Pfeiffer, Joachim ; Peerlings, J. ; Riemenschneider, R. ; Genovese, R. ; Aziz, M. ; Goutain, E. ; Künzel, H. ; Görtz, W. ; Böhm, G. (1999)
InAlGaAs bulk-micromachined tunable Fabry-Pérot filter for dense WDM systems.
Conference or Workshop Item, Bibliographie

Pfeiffer, Joachim ; Riemenschneider, R. ; Mutamba, K. ; Peerlings, J. ; Afshar, B. E. ; Baaser, Herbert ; Grunert, D. ; Meissner, P. ; Hartnagel, H. L. (1999)
Indium phosphide based bulked micromachining technology for micromechanically tunable WDM filter applications.
Conference or Workshop Item, Bibliographie

Hartnagel, Hans L. ; Mutamba, K. ; Pfeiffer, J. ; Riemenschneider, R. ; Peerlings, J. (1999)
MEMS for sensing and optical communication systems.
In: Compound semiconductor, 5
Article, Bibliographie

Dehé, Alfons ; Peerlings, J. ; Pfeiffer, J. ; Riemenschneider, R. ; Vogt, A. ; Streubel, K. ; Künzel, H. ; Meißner, P. ; Hartnagel, H. L. (1998)
III-V Compound semiconductor micromachined actuators for long resonator tunable Fabry-Pérot detectors.
In: Sensors and Actuators A : Physical, 68 (1-3)
doi: 10.1016/S0924-4247(98)00071-5
Article, Bibliographie

Peerlings, Joachim ; Riemenschneider, R. ; Strassner, M. ; Scheuer, V. ; Naveen Kumar, V. ; Mutamba, K. ; Pfeiffer, J. ; Herbst, S. ; Hartnagel, H. L. (1998)
In GaAs/InP Fabry-Pérot pin receiver for dense wavelength division multiplex systems.
Conference or Workshop Item, Bibliographie

Pfeiffer, Joachim ; Riemenschneider, R. ; Peerlings, J. ; Dehé, A. ; Mutamba, K. ; Meissner, P. ; Hartnagel, H. L. (1998)
InP bulk micromachined tunable Bragg mirrors for optical filter applications in WDM systems.
Conference or Workshop Item, Bibliographie

Peerlings, Joachim ; Naveen Kumar, V. ; Riemenschneider, R. ; Strassner, M. ; Pfeiffer, J. ; Daleiden, J. ; Scheuer, V. ; Mutamba, K. ; Herbst, S. (1998)
Integration of InGaAs/InP Pin diodes with Fabry-Pérot filters for wavelength selective receivers.
Conference or Workshop Item, Bibliographie

Neubeck, K. ; Rodewald, M. ; Riemenschneider, R. ; Rück, D. M. ; Baumann, H. ; Hahn, H. ; Balogh, Adam G. (1997)
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation.
In: Materials Science Forum Vol. 248-249
Article, Bibliographie

Mutamba, Kabula ; Pfeiffer, J. ; Peerlings, J. ; Riemenschneider, R. ; Vogt, Alexander ; Dehé, A. ; Brauch, M. ; Meister, B. ; Dragojevic, N. (1997)
ANSYS-structural design of micromachined Fabry-Pérot filter with planar membranes.
Conference or Workshop Item, Bibliographie

Neubeck, K. ; Rodewald, M. ; Riemenschneider, R. ; Rück, D. M. ; Baumann, H. ; Hahn, Horst ; Balogh, Adam G. (1997)
Characterisation of Cu/Al2O3 interfaces after heavy ion irradiation.
In: Materials Science Forum, 248/249
doi: 10.4028/www.scientific.net/MSF.248-249.125
Article, Bibliographie

Gottwald, P. ; Riemenschneider, R. ; Szentpali, B. ; Hartnagel, H. L. ; Kincses, Z. ; Ruszinko, M. (1995)
Comparison of photo- and plasma-assisted passivating process effects on GaAs devices by means of low-frequency noise measurements.
In: Solid state electronics, 38 (2)
doi: 10.1016/0038-1101(94)00100-T
Article, Bibliographie

This list was generated on Sat Dec 7 01:27:36 2024 CET.