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Number of items: 4.

Horn, Joachim (1998)
Lumineszenzuntersuchungen an Verbindungshalbleitern nach Anregung mit einem Rastertunnelmikroskop.
Technische Universität Darmstadt
Ph.D. Thesis, Bibliographie

Iida, Tsutomu ; Makita, Yunosuke ; Shima, Takayuki ; Kimura, Shinji ; Horn, Joachim ; Hartnagel, Hans L. ; Uekusa, Shin‐ichiro (1996)
C+-energy-dependent residual ion damage in GaAs: C grown by the low-energy ion-beam doping method.
In: Journal of Applied Physics, 80 (7)
doi: 10.1063/1.363306
Article, Bibliographie

Horn, Joachim ; Pavlidis, Dimitris ; Park, Yongjo ; Hartnagel, Hans L. (1996)
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: Materials Science and Engineering: B, 44 (1/3)
doi: 10.1016/S0921-5107(96)01791-6
Article, Bibliographie

Horn, Joachim ; Marx, ; Weiss, ; Hartnagel, ; Stehle, ; Bischoff, ; Pagnia, (1995)
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors, Edition: Aedermannsdorf: Trans Tech Publ., 1995
Book Section, Bibliographie

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