Horn, Joachim (1998):
Lumineszenzuntersuchungen an Verbindungshalbleitern nach Anregung mit einem Rastertunnelmikroskop.
Aachen: Shaker, 1998. VIII,129 S, Aachen, Shaker, TU Darmstadt,
[Ph.D. Thesis]

Horn, Joachim ; Pavlidis, ; Park, ; Hartnagel, (1996):
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: EXMATEC: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies <3, 1996, Breisgau>: Proceedings, [Conference or Workshop Item]

Horn, Joachim ; Vogt, ; Aller, ; Hartnagel, (1996):
Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of vacuum science and technology. B 14 (1996), S. 820-823, [Article]

Horn, Joachim ; Marx, ; Weiss, ; Hartnagel, ; Stehle, ; Bischoff, ; Pagnia, (1995):
High resolution surface characterization using STM light emission techniques.
185-18, In: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154, Aedermannsdorf: Trans Tech Publ., 1995, Aedermannsdorf, Trans Tech Publ, [Book Section]