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Scanning tunneling microscopy characterization of MOCVD grown GaN

Horn, Joachim and Pavlidis, and Park, and Hartnagel, (1996):
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: EXMATEC: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies <3, 1996, Breisgau>: Proceedings, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1996
Creators: Horn, Joachim and Pavlidis, and Park, and Hartnagel,
Title: Scanning tunneling microscopy characterization of MOCVD grown GaN
Language: English
Series Name: EXMATEC: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies <3, 1996, Breisgau>: Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
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