Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. ; Stehle, M. ; Bischoff, M. ; Pagnia, H. (1995)
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors
Buchkapitel, Bibliographie

Stehle, M. ; Bischoff, M. ; Pagnia, H. ; Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. (1995)
Time-resolved luminscence measurements on GaAs homostructures using pulse excitation of a scanning tunneling microscope.
In: Journal of Vacuum Science and Technology B, 13
doi: 10.1116/1.588370
Artikel, Bibliographie