TU Darmstadt / ULB / TUbiblio

High resolution surface characterization using STM light emission techniques

Horn, Joachim and Marx, and Weiss, and Hartnagel, and Stehle, and Bischoff, and Pagnia, (1995):
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154, Aedermannsdorf, Trans Tech Publ, [Book Section]

Item Type: Book Section
Erschienen: 1995
Creators: Horn, Joachim and Marx, and Weiss, and Hartnagel, and Stehle, and Bischoff, and Pagnia,
Title: High resolution surface characterization using STM light emission techniques
Language: German
Title of Book: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154
Volume: 185-18
Place of Publication: Aedermannsdorf
Publisher: Trans Tech Publ
Edition: Aedermannsdorf: Trans Tech Publ., 1995
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 15:58
License: [undefiniert]
Export:

Optionen (nur für Redakteure)

View Item View Item