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Number of items: 7.

Tarnawski, Z. and Zakrzewska, K. and Kim-Ngan, N.-T. H. and Krupska, M. and Sowa, S. and Drogowska, K. and Havela, L. and Balogh, A. G. (2015):
Study of Ti, V and Their Oxides-Based Thin Films in the Search for Hydrogen Storage Materials.
In: Acta Physica Polonica A, 128 (2), pp. 431-440. ISSN 0587-4246, 1898-794X,
[Article]

Tarnawski, Z. and Zakrzewska, K. and Kim-Ngan, N.-T. H. and Krupska, M. and Sowa, S. and Drogowska, K. and Havela, L. and Balogh, A. G. (2015):
Hydrogen storage in Ti, V and their oxides-based thin films.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 6 (1), pp. 013002. IOP Publishing, ISSN 2043-6262,
[Article]

Tarnawski, Z. and Kim-Ngan, Nhu-T. H. and Zakrzewska, K. and Drogowska, K. and Brudnik, A. and Balogh, A. G. and Kuzel, R. and Havela, L. and Sechovsky, V. (2013):
Hydrogen storage in Ti-TiO2 multilayers.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 4 (2), pp. 025004. [Article]

Drogowska, K. and Flege, Stefan and Becker, H.-W. and Tarnawski, Z. and Zakrzewska, K. and Balogh, A. G. (2013):
Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods.
1, In: Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites, pp. 124-127, CRC Press, ISBN 978-1-4822-0581-7,
[Book Section]

Drogowska, K. and Tarnawski, Z. and Brudnik, A. and Kusior, E. and Sokolowski, M. and Zakrzewska, K. and Reszka, A. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2012):
RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering.
In: Materials Research Bulletin, 47 (2), pp. 296-301. Elsevier Science Publishing Company, [Article]

Drogowska, K. and Flege, Stefan and Schmitt, C. and Rogalla, D. and Becker, H.-W. and Nhu-Tarnawska, H. K. N. and Brudnik, A. and Tarnawski, Z. and Zakrzewska, K. and Marszalek, M. and Balogh, A. G. (2012):
Hydrogen Charging Effects in Pd/Ti/TiO2/Ti Thin Films Deposited on Si(111) Studied by Ion Beam Analysis Methods.
In: Advances in Materials Science and Engineering, 2012, pp. 269603-1-269603-8. Hindawi Publishing Corporation, [Article]

Drogowska, K. and Kim-Ngan, N.-T. H. and Balogh, A. G. and Radecka, M. and Brudnik, A. and Zakrzewska, K. and Tarnawski, Z. (2010):
Diffusion and chemical composition of TiNxOy thin films studied by Rutherford Backscattering Spectroscopy.
In: Surface Science, 604 (11-12), pp. 1010-1014. Elsevier Science Publishing Company, [Article]

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