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Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods

Drogowska, K. and Flege, Stefan and Becker, H.-W. and Tarnawski, Z. and Zakrzewska, K. and Balogh, A. G. (2013):
Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods.
In: Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites, CRC Press, pp. 124-127, [Book Section]

Item Type: Book Section
Erschienen: 2013
Creators: Drogowska, K. and Flege, Stefan and Becker, H.-W. and Tarnawski, Z. and Zakrzewska, K. and Balogh, A. G.
Title: Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods
Language: English
Title of Book: Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites
Volume: 1
Publisher: CRC Press
ISBN: 978-1-4822-0581-7
Divisions: 11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences
Date Deposited: 18 Mar 2014 15:27
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