2015

Tarnawski, Z. ; Zakrzewska, K. ; Kim-Ngan, N.-T. H. ; Krupska, M. ; Sowa, S. ; Drogowska, K. ; Havela, L. ; Balogh, A. G. (2015)
Study of Ti, V and Their Oxides-Based Thin Films in the Search for Hydrogen Storage Materials.
In: Acta Physica Polonica A, 128 (2)
Artikel, Bibliographie

Tarnawski, Z. ; Zakrzewska, K. ; Kim-Ngan, N.-T. H. ; Krupska, M. ; Sowa, S. ; Drogowska, K. ; Havela, L. ; Balogh, A. G. (2015)
Hydrogen storage in Ti, V and their oxides-based thin films.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 6 (1)
doi: 10.1088/2043-6262/6/1/013002
Artikel, Bibliographie

2013

Tarnawski, Z. ; Kim-Ngan, Nhu-T. H. ; Zakrzewska, K. ; Drogowska, K. ; Brudnik, A. ; Balogh, A. G. ; Kuzel, R. ; Havela, L. ; Sechovsky, V. (2013)
Hydrogen storage in Ti-TiO2 multilayers.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 4 (2)
Artikel, Bibliographie

Drogowska, K. ; Flege, Stefan ; Becker, H.-W. ; Tarnawski, Z. ; Zakrzewska, K. ; Balogh, A. G. (2013)
Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods.
In: Nanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites
Buchkapitel, Bibliographie

2012

Drogowska, K. ; Tarnawski, Z. ; Brudnik, A. ; Kusior, E. ; Sokolowski, M. ; Zakrzewska, K. ; Reszka, A. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2012)
RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering.
In: Materials Research Bulletin, 47 (2)
Artikel, Bibliographie

Drogowska, K. ; Flege, Stefan ; Schmitt, C. ; Rogalla, D. ; Becker, H.-W. ; Nhu-Tarnawska, H. K. N. ; Brudnik, A. ; Tarnawski, Z. ; Zakrzewska, K. ; Marszalek, M. ; Balogh, A. G. (2012)
Hydrogen Charging Effects in Pd/Ti/TiO2/Ti Thin Films Deposited on Si(111) Studied by Ion Beam Analysis Methods.
In: Advances in Materials Science and Engineering, 2012
Artikel, Bibliographie

2010

Drogowska, K. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Radecka, M. ; Brudnik, A. ; Zakrzewska, K. ; Tarnawski, Z. (2010)
Diffusion and chemical composition of TiNxOy thin films studied by Rutherford Backscattering Spectroscopy.
In: Surface Science, 604 (11-12)
Artikel, Bibliographie