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Influence of post-hydrogenation upon electrical, optical and structural properties of hydrogen-less sputter-deposited amorphous silicon.
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Physical properties of multilayer thin films of Ti-V and their hydrides studied by ion beam analysis methods.
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Drogowska, K. ; Flege, Stefan ; Rogalla, D. ; Becker, H.-W. ; Ionescu, Emanuel ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2013)
Hydrogen content analysis in hydrogen-charged PZT ferroelectric ceramics.
In: Solid State Ionics, 235
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Drogowska, K. ; Flege, Stefan ; Schmitt, C. ; Rogalla, D. ; Becker, H.-W. ; Nhu-Tarnawska, H. K. N. ; Brudnik, A. ; Tarnawski, Z. ; Zakrzewska, K. ; Marszalek, M. ; Balogh, A. G. (2012)
Hydrogen Charging Effects in Pd/Ti/TiO2/Ti Thin Films Deposited on Si(111) Studied by Ion Beam Analysis Methods.
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