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Number of items: 6.

Tarnawski, Z. ; Zakrzewska, K. ; Kim-Ngan, N.-T. H. ; Krupska, M. ; Sowa, S. ; Drogowska, K. ; Havela, L. ; Balogh, A. G. (2015):
Study of Ti, V and Their Oxides-Based Thin Films in the Search for Hydrogen Storage Materials.
In: Acta Physica Polonica A, 128 (2), pp. 431-440. ISSN 0587-4246, 1898-794X,
[Article]

Tarnawski, Z. ; Zakrzewska, K. ; Kim-Ngan, N.-T. H. ; Krupska, M. ; Sowa, S. ; Drogowska, K. ; Havela, L. ; Balogh, A. G. (2015):
Hydrogen storage in Ti, V and their oxides-based thin films.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 6 (1), pp. 013002. IOP Publishing, ISSN 2043-6262,
[Article]

Tarnawski, Z. ; Kim-Ngan, Nhu-T. H. ; Zakrzewska, K. ; Drogowska, K. ; Brudnik, A. ; Balogh, A. G. ; Kuzel, R. ; Havela, L. ; Sechovsky, V. (2013):
Hydrogen storage in Ti-TiO2 multilayers.
In: Advances in Natural Sciences: Nanoscience and Nanotechnology, 4 (2), pp. 025004. [Article]

Kim-Ngan, Nhu-T. H. ; Havela, L. ; Adamska, A. M. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Eloirdi, R. ; Huber, F. ; Gouder, T. ; Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1), pp. 012012. IOP Publishing, ISSN 1742-6596,
[Article]

Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Havela, L. ; Gouder, T. (2010):
Ion beam mixing in uranium nitride thin films studied by Rutherford Backscattering Spectroscopy.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268 (11-12), pp. 1875-1879. Elsevier Science Publishing Company, [Article]

Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2010):
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1), pp. 012057. IOP Publishing, [Article]

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