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Drogowska, K. and Tarnawski, Z. and Brudnik, A. and Kusior, E. and Sokolowski, M. and Zakrzewska, K. and Reszka, A. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2012):
RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering.
In: Materials Research Bulletin, Elsevier Science Publishing Company, pp. 296-301, 47, (2), [Online-Edition: http://www.sciencedirect.com/science/article/pii/S0025540811...],
[Article]

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