TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Number of items: 1.

Drogowska, K. and Tarnawski, Z. and Brudnik, A. and Kusior, E. and Sokolowski, M. and Zakrzewska, K. and Reszka, A. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2012):
RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering.
47, In: Materials Research Bulletin, (2), Elsevier Science Publishing Company, pp. 296-301, [Online-Edition: http://www.sciencedirect.com/science/article/pii/S0025540811...],
[Article]

This list was generated on Sat Dec 7 02:01:41 2019 CET.