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Jump to: 2009
Number of items: 3.

2009

Gigler, A. M. and Huber, A. J. and Bauer, M. and Ziegler, A. and Hillenbrand, R. and Stark, R. W. (2009):
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, pp. pp. 22351–22357, vol. 1, [Article]

Bauer, M. and Gigler, A. M. and Huber, A. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature depending Raman line-shift of silicon carbide.
In: J. Raman Spetrosc, pp. pp. 1867 - 1874, vol. 4, [Article]

Bauer, M. and Gigler, A. M. and Huber, A. J. and Hillenbrand, R. and Stark, R. W. (2009):
Temperature-depending Raman line-shift of silicon carbide.
In: Journal of Raman Spectroscopy, pp. 1867-1874, 40, (12), ISSN 0377-0486,
[Online-Edition: http://dx.doi.org/10.1002/jrs.2334],
[Article]

This list was generated on Tue Jun 18 00:19:44 2019 CEST.