2019

Niu, Gang ; Calka, Pauline ; Huang, Peng ; Sharath, Sankaramangalam Ulhas ; Petzold, Stefan ; Gloskovskii, Andrei ; Fröhlich, Karol ; Zhao, Yudi ; Kang, Jinfeng ; Schubert, Markus Andreas ; Bärwolf, Florian ; Ren, Wei ; Ye, Zuo-Guang ; Perez, Eduardo ; Wenger, Christian ; Alff, Lambert ; Schroeder, Thomas (2019)
Operando diagnostic detection of interfacial oxygen ‘breathing’ of resistive random access memory by bulk-sensitive hard X-ray photoelectron spectroscopy.
In: Materials Research Letters, 7 (3)
doi: 10.1080/21663831.2018.1561535
Artikel, Bibliographie

2017

Sharath, Sankaramangalam Ulhas ; Vogel, Stefan ; Molina-Luna, Leopoldo ; Hildebrandt, Erwin ; Wenger, Christian ; Kurian, Jose ; Dürrschnabel, Michael ; Niermann, Tore ; Niu, Gang ; Calka, Pauline ; Lehmann, Michael ; Kleebe, Hans-Joachim ; Schroeder, Thomas ; Alff, Lambert (2017)
Control of Switching Modes and Conductance Quantization in Oxygen Engineered HfOx based Memristive Devices.
In: Advanced Functional Materials, 27 (32)
doi: 10.1002/adfm.201700432
Artikel, Bibliographie

2016

Niu, Gang ; Calka, Pauline ; Auf der Maur, Matthias ; Santoni, Francesco ; Guha, Subhajit ; Fraschke, Mirko ; Hamoumou, Philippe ; Gautier, Brice ; Perez, Eduardo ; Walczyk, Christian ; Wenger, Christian ; Di Carlo, Aldo ; Alff, Lambert ; Schroeder, Thomas (2016)
Geometric conductive filament confinement by nanotips for resistive switching of HfO2-RRAM devices with high performance.
In: Scientific Reports, 6
doi: 10.1038/srep25757
Artikel, Bibliographie

2014

Niu, Gang ; Hildebrandt, Erwin ; Schubert, Markus Andreas ; Boscherini, Federico ; Zoellner, Marvin Hartwig ; Alff, Lambert ; Walczyk, Damian ; Zaumseil, Peter ; Costina, Ioan ; Wilkens, Henrik ; Schroeder, Thomas (2014)
Oxygen Vacancy Induced Room Temperature Ferromagnetism in Pr-Doped CeO2 Thin Films on Silicon.
In: ACS Applied Materials & Interfaces, 6 (20)
doi: 10.1021/am502238w
Artikel, Bibliographie

Sowinska, Malgorzata ; Bertaud, Thomas ; Walczyk, Damian ; Thiess, Sebastian ; Calka, Pauline ; Alff, Lambert ; Walczyk, Christian ; Schroeder, Thomas (2014)
In-operando hard X-ray photoelectron spectroscopy study on the impact of current compliance and switching cycles on oxygen and carbon defects in resistive switching Ti/HfO2/TiN cells.
In: Journal of Applied Physics, 115 (20)
doi: 10.1063/1.4879678
Artikel, Bibliographie

2011

Hildebrandt, Erwin ; Kurian, Jose ; Müller, Mathis M. ; Schroeder, Thomas ; Kleebe, Hans-Joachim ; Alff, Lambert (2011)
Controlled oxygen vacancy induced p-type conductivity in HfO2−x thin films.
In: Applied Physics Letters, 99 (11)
doi: 10.1063/1.3637603
Artikel, Bibliographie