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Number of items: 4.

Hoffmann, P. S. ; Fainer, N. I. ; Baake, O. ; Kosinova, M. L. ; Rumyantsev, Y. M. ; Trunova, V. A. ; Klein, Andreas ; Pollakowski, B. ; Beckhoff, B. ; Ensinger, W. (2012)
Silicon carbonitride nanolayers - Synthesis and chemical characterization.
In: Thin Solid Films, 520 (18)
doi: 10.1016/j.tsf.2012.04.082
Article, Bibliographie

Baake, Olaf ; Hoffmann, P. S. ; Ensinger, Wolfgang ; Klein, Andreas ; Beckhoff, B. ; Polakovski, P. ; Ulm, G. ; Trunova, V. A. ; Kosinova, M. L. ; Sulyaeva, V. S. ; Rumjantsev, Yu. M. ; Fainer, N. I. ; Kuznetsov, F. A. (2011)
Bestimmung chemischer Bindungen in dünnen Schichten von Borcarbonitrid BCxNy mit Hilfe von XPS und TXRF-NEXAFS.
In: Zavodskaya Laboratoriya: diagnostika materialov, 77 (5)
Article, Bibliographie

Baake, O. ; Hoffmann, P. S. ; Kosinova, M. L. ; Klein, Andreas ; Pollakowski, B. ; Beckhoff, B. ; Fainer, N. I. ; Trunova, V. A. ; Ensinger, W. (2010)
Analytical characterization of BCxNy films generated by LPCVD with triethylamine borane.
In: Analytical and Bioanalytical Chemistry, 398 (2)
doi: 10.1007/s00216-010-3965-4
Article, Bibliographie

Baake, O. ; Fainer, N. I. ; Hoffmann, P. S. ; Kosinova, M. L. ; Rumyantsev, Y. M. ; Trunova, V. A. ; Klein, Andreas ; Ensinger, W. ; Pollakowski, B. ; Beckhoff, B. ; Ulm, G. (2009)
Chemical characterization of SiCxNy nanolayers by FTIR-and Raman spectroscopy, XPS and TXRF-NEXAFS.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 603 (1-2)
doi: 10.1016/j.nima.2009.03.007
Article, Bibliographie

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