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Number of items: 4.

Hoffmann, P. S. and Fainer, N. I. and Baake, O. and Kosinova, M. L. and Rumyantsev, Y. M. and Trunova, V. A. and Klein, Andreas and Pollakowski, B. and Beckhoff, B. and Ensinger, W. (2012):
Silicon carbonitride nanolayers - Synthesis and chemical characterization.
In: Thin Solid Films, pp. 5906-5913, 520, (18), ISSN 00406090,
[Online-Edition: http://www.sciencedirect.com/science/article/pii/S0040609012...],
[Article]

Baake, Olaf and Hoffmann, P. S. and Ensinger, Wolfgang and Klein, Andreas and Beckhoff, B. and Polakovski, P. and Ulm, G. and Trunova, V. A. and Kosinova, M. L. and Sulyaeva, V. S. and Rumjantsev, Yu. M. and Fainer, N. I. and Kuznetsov, F. A. (2011):
Bestimmung chemischer Bindungen in dünnen Schichten von Borcarbonitrid BCxNy mit Hilfe von XPS und TXRF-NEXAFS.
In: Zavodskaya Laboratoriya: diagnostika materialov, pp. 12-16, 77, (5), [Online-Edition: http://zldm.ru/content/article.php?ID=1134],
[Article]

Baake, O. and Hoffmann, P. S. and Kosinova, M. L. and Klein, Andreas and Pollakowski, B. and Beckhoff, B. and Fainer, N. I. and Trunova, V. A. and Ensinger, W. (2010):
Analytical characterization of BCxNy films generated by LPCVD with triethylamine borane.
In: Analytical and Bioanalytical Chemistry, Springer-Verlag, pp. 1077-1084, 398, (2), [Online-Edition: http://www.springerlink.com/content/r7v273023pv54416/],
[Article]

Baake, O. and Fainer, N. I. and Hoffmann, P. S. and Kosinova, M. L. and Rumyantsev, Y. M. and Trunova, V. A. and Klein, Andreas and Ensinger, W. and Pollakowski, B. and Beckhoff, B. and Ulm, G. (2009):
Chemical characterization of SiCxNy nanolayers by FTIR-and Raman spectroscopy, XPS and TXRF-NEXAFS.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, pp. 174-177, 603, (1-2), ISSN 01689002,
[Online-Edition: http://www.sciencedirect.com/science/article/B6TJM-4VT14C7-1...],
[Article]

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