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Baake, Olaf ; Hoffmann, P. S. ; Ensinger, Wolfgang ; Klein, Andreas ; Beckhoff, B. ; Polakovski, P. ; Ulm, G. ; Trunova, V. A. ; Kosinova, M. L. ; Sulyaeva, V. S. ; Rumjantsev, Yu. M. ; Fainer, N. I. ; Kuznetsov, F. A. (2011):
Bestimmung chemischer Bindungen in dünnen Schichten von Borcarbonitrid BCxNy mit Hilfe von XPS und TXRF-NEXAFS.
In: Zavodskaya Laboratoriya: diagnostika materialov, 77 (5), pp. 12-16. [Article]

Baake, O. ; Fainer, N. I. ; Hoffmann, P. S. ; Kosinova, M. L. ; Rumyantsev, Y. M. ; Trunova, V. A. ; Klein, Andreas ; Ensinger, W. ; Pollakowski, B. ; Beckhoff, B. ; Ulm, G. (2009):
Chemical characterization of SiCxNy nanolayers by FTIR-and Raman spectroscopy, XPS and TXRF-NEXAFS.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 603 (1-2), pp. 174-177. ISSN 01689002,
[Article]

Hoffmann, P. ; Baake, O. ; Beckhoff, B. ; Ensinger, W. ; Fainer, N. ; Klein, Andreas ; Kosinova, M. ; Pollakowski, B. ; Trunova, V. ; Ulm, G. ; Weser, J. (2007):
Chemical bonding in carbonitride nanolayers.
In: Nuclear Instruments and Methods in Physics Research Section A, 575 (1-2), pp. 78-84. Elsevier, [Article]

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