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Hoffmann, P. S. and Fainer, N. I. and Baake, O. and Kosinova, M. L. and Rumyantsev, Y. M. and Trunova, V. A. and Klein, Andreas and Pollakowski, B. and Beckhoff, B. and Ensinger, W. (2012):
Silicon carbonitride nanolayers - Synthesis and chemical characterization.
In: Thin Solid Films, pp. 5906-5913, 520, (18), ISSN 00406090,
[Online-Edition: http://www.sciencedirect.com/science/article/pii/S0040609012...],
[Article]

Baake, O. and Fainer, N. I. and Hoffmann, P. S. and Kosinova, M. L. and Rumyantsev, Y. M. and Trunova, V. A. and Klein, Andreas and Ensinger, W. and Pollakowski, B. and Beckhoff, B. and Ulm, G. (2009):
Chemical characterization of SiCxNy nanolayers by FTIR-and Raman spectroscopy, XPS and TXRF-NEXAFS.
In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, pp. 174-177, 603, (1-2), ISSN 01689002,
[Online-Edition: http://www.sciencedirect.com/science/article/B6TJM-4VT14C7-1...],
[Article]

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