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Number of items: 11.

Article

Bayer, Thorsten J. M. ; Carter, J. J. ; Wang, Jian-Jun ; Klein, Andreas ; Chen, Long-Qing ; Randall, Clive A. (2021):
Determination of electrical properties of degraded mixed ionic conductors: Impedance studies with applied dc voltage. (Publisher's Version)
In: Journal of Applied Physics, 122 (24), AIP Publishing, ISSN 0021-8979, e-ISSN 1089-7550,
DOI: 10.26083/tuprints-00019913,
[Article]

Rachut, Karsten ; Bayer, Thorsten J. M. ; Wolff, Jan O. ; Kmet, Brigita ; Benčan, Andreja ; Klein, Andreas (2019):
Off‐Stoichiometry of Magnetron Sputtered Ba 1− x Sr x TiO 3 Thin Films.
In: physica status solidi (b), p. 1900148. ISSN 0370-1972,
DOI: 10.1002/pssb.201900148,
[Article]

Weidner, Mirko ; Fuchs, Anne ; Bayer, Thorsten J. M. ; Rachut, Karsten ; Schnell, Patrick ; Deyu, Getnet K. ; Klein, Andreas (2019):
Defect Modulation Doping.
In: Advanced Functional Materials, 29 (14), p. 1807906. Wiley VCH, Weinheim, Germany, ISSN 1616301X,
DOI: 10.1002/adfm.201807906,
[Article]

Giesecke, Ruth ; Hertwig, Ramis ; Bayer, Thorsten J. M. ; Randall, Clive A. ; Klein, Andreas (2017):
Modification of the Schottky Barrier Height at the RuO2 Cathode During Resistance Degradation of Fe-doped SrTiO3.
In: Journal of the American Ceramic Society, 100 (10), pp. 4590-4601. ISSN 00027820,
[Article]

Wang, Jian-Jun ; Huang, Hou-Bing ; Bayer, Thorsten J. M. ; Moballegh, Ali ; Cao, Ye ; Klein, Andreas ; Dickey, Elizabeth C. ; Irving, Douglas L. ; Randall, Clive A. ; Chen, Long-Qing (2016):
Defect chemistry and resistance degradation in Fe-doped SrTiO3 single crystal.
In: Acta Materialia, 108, pp. 229-240. ISSN 13596454,
[Article]

Deuermeier, Jonas ; Bayer, Thorsten J. M. ; Yanagi, Hiroshi ; Kiazadeh, Asal ; Martins, Rodrigo ; Klein, Andreas ; Fortunato, Elvira (2016):
Substrate reactivity as the origin of Fermi level pinning at the Cu2O/ALD-Al2O3interface.
In: Materials Research Express, 3 (4), pp. 046404. ISSN 2053-1591,
[Article]

Hillmann, Stephan ; Rachut, Karsten ; Bayer, Thorsten J. M. ; Li, Shunyi ; Klein, Andreas (2015):
Application of atomic layer deposited Al2O3as charge injection layer for high-permittivity dielectrics.
In: Semiconductor Science and Technology, 30 (2), pp. 024012(1-7). ISSN 0268-1242,
[Article]

Li, Shunyi ; Chen, Feng ; Schafranek, Robert ; Bayer, Thorsten J. M. ; Rachut, Karsten ; Fuchs, Anne ; Siol, Sebastian ; Weidner, Mirko ; Hohmann, Mareike ; Pfeifer, Verena ; Morasch, Jan ; Ghinea, Cosmina ; Arveux, Emmanuel ; Günzler, Richard ; Gassmann, Jürgen ; Körber, Christoph ; Gassenbauer, Yvonne ; Säuberlich, Frank ; Rao, Gutlapalli Venkata ; Payan, Sandrine ; Maglione, Mario ; Chirila, Cristina ; Pintilie, Lucian ; Jia, Lichao ; Ellmer, Klaus ; Naderer, Michael ; Reichmann, Klaus ; Böttger, Ulrich ; Schmelzer, Sebastian ; Frunza, Raluca C. ; Uršič, Hana ; Malič, Barbara ; Wu, Wen-Bin ; Erhart, Paul ; Klein, Andreas (2014):
Intrinsic energy band alignment of functional oxides.
In: physica status solidi (RRL) - Rapid Research Letters, 8 (6), pp. 571-576. ISSN 18626254,
[Article]

Bayer, Thorsten J. M. ; Wachau, André ; Fuchs, Anne ; Deuermeier, Jonas ; Klein, Andreas (2012):
Atomic Layer Deposition of Al2O3 onto Sn-Doped In2O3: Absence of Self-Limited Adsorption during Initial Growth by Oxygen Diffusion from the Substrate and Band Offset Modification by Fermi Level Pinning in Al2O3.
In: Chemistry of Materials, 24 (23), pp. 4503-4510. ISSN 0897-4756,
[Article]

Hohmann, Mareike V. ; Ágoston, Péter ; Wachau, André ; Bayer, Thorsten J. M. ; Broetz, Joachim ; Albe, Karsten ; Klein, Andreas (2011):
Orientation dependent ionization potential of In2O3: A natural source for inhomogeneous barrier formation at electrode interfaces in organic electronics.
In: Journal of Physics: Condensed Matter, 23 (33), p. 334203. IOP Publishing, ISSN 0953-8984,
[Article]

Li, Shunyi ; Ghinea, Cosmina ; Bayer, Thorsten J. M. ; Motzko, Markus ; Schafranek, Robert ; Klein, Andreas (2011):
Electrical properties of (Ba,Sr)TiO3 thin films with Pt and ITO electrodes: dielectric and rectifying behaviour.
In: Journal of Physics: Condensed Matter, 23 (33), p. 334202. ISSN 0953-8984,
[Article]

This list was generated on Sat Aug 20 00:14:57 2022 CEST.