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Number of items: 5.

Cherkashinin, Gennady and Motzko, Markus and Schulz, Natalia and Späth, Thomas and Jaegermann, Wolfram (2015):
Electron Spectroscopy Study of Li[Ni,Co,Mn]O2/Electrolyte Interface: Electronic Structure, Interface Composition, and Device Implications.
27, In: Chemistry of Materials, (8), pp. 2875-2887, ISSN 0897-4756, [Online-Edition: http://dx.doi.org/10.1021/cm5047534],
[Article]

Hausbrand, René and Schwöbel, André and Jaegermann, Wolfram and Motzko, Markus and Ensling, David (2015):
Surface and Interface Analysis of LiCoO2 and LiPON Thin Films by Photoemission: Implications for Li-Ion Batteries.
229, In: Zeitschrift für Physikalische Chemie, (9), pp. 1387-1414, ISSN 0942-9352, [Online-Edition: http://dx.doi.org/10.1515/zpch-2014-0664],
[Article]

Schwöbel, André and Precht, Ruben and Motzko, Markus and Carrillo Solano, Mercedes A. and Calvet, Wolfram and Hausbrand, René and Jaegermann, Wolfram (2014):
Determination of the valence band structure of an alkali phosphorus oxynitride glass: A synchrotron XPS study on LiPON.
321, In: Applied Surface Science, Elsevier Science Publishing, pp. 55-60, ISSN 01694332, [Online-Edition: http://dx.doi.org/10.1016/j.apsusc.2014.09.174],
[Article]

Schaffner, Judith and Motzko, Markus and Tueschen, Alexander and Swirschuk, Andreas and Schimper, Hermann-Josef and Klein, Andreas and Modes, Thomas and Zywitzki, Olaf and Jaegermann, Wolfram (2011):
12% efficient CdTe/CdS thin film solar cells deposited by low-temperature close space sublimation.
110, In: Journal of Applied Physics, pp. 064508, ISSN 00218979, [Article]

Li, Shunyi and Ghinea, Cosmina and Bayer, Thorsten J. M. and Motzko, Markus and Schafranek, Robert and Klein, Andreas (2011):
Electrical properties of (Ba,Sr)TiO3 thin films with Pt and ITO electrodes: dielectric and rectifying behaviour.
23, In: Journal of Physics: Condensed Matter, (33), p. 334202, ISSN 0953-8984, [Online-Edition: http://dx.doi.org/10.1088/0953-8984/23/33/334202],
[Article]

This list was generated on Tue Jan 28 02:23:10 2020 CET.