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Casper, Thorben and De Gersem, Herbert and Gillon, Renaud and Gotthans, Tomas and Kratochvíl, Tomáš and Meuris, Peter and Schöps, Sebastian
Fanucci, Luca and Teich, Jürgen (eds.) :

Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries.
[Online-Edition: http://ieeexplore.ieee.org/document/7459510]
In: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE , pp. 1297-1302. ISBN 978-3-9815370-6-2
[Book Section] , (2016)

Günther, Michael and Putek, Piotr and ter Maten, E. Jan W. and Pulch, Roland and Schoenmaker, Wim and Meuris, Peter and Wieers, Aarnout and Deleu, Frederik :
Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device.
In: MATHMOD 2015 - 8th Vienna International Conference on Mathematical Modelling.
[Conference or Workshop Item] , (2015)

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