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Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries

Casper, Thorben and De Gersem, Herbert and Gillon, Renaud and Gotthans, Tomas and Kratochvíl, Tomáš and Meuris, Peter and Schöps, Sebastian
Fanucci, Luca and Teich, Jürgen (eds.) (2016):
Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries.
In: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, pp. 1297-1302, [Online-Edition: http://ieeexplore.ieee.org/document/7459510],
[Book Section]

Item Type: Book Section
Erschienen: 2016
Editors: Fanucci, Luca and Teich, Jürgen
Creators: Casper, Thorben and De Gersem, Herbert and Gillon, Renaud and Gotthans, Tomas and Kratochvíl, Tomáš and Meuris, Peter and Schöps, Sebastian
Title: Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries
Language: German
Title of Book: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Publisher: IEEE
ISBN: 978-3-9815370-6-2
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields)
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory (from 01.01.2019 renamed Institute for Accelerator Science and Electromagnetic Fields) > Computational Engineering (from 01.01.2019 renamed Computational Electromagnetics)
Exzellenzinitiative
Exzellenzinitiative > Graduate Schools
Exzellenzinitiative > Graduate Schools > Graduate School of Computational Engineering (CE)
Event Title: Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Date Deposited: 10 Apr 2017 21:51
Official URL: http://ieeexplore.ieee.org/document/7459510
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TEMF-Pub-DB TEMF002530

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