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Number of items: 3.

ter Maten, E. Jan W. and Brachtendorf, Hans-Georg and Pulch, Roland and Schoenmaker, Wim and De Gersem, Herbert (eds.) (2019):
Nanoelectronic Coupled Problems Solutions.
29In: Mathematics in Industry, Cham, Springer, ISBN 978-3-030-30725-7,
DOI: 10.1007/978-3-030-30726-4,
[Online-Edition: https://www.springer.com/gp/book/9783030307257],

Casper, Thorben and De Gersem, Herbert and Gotthans, Tomas and Schoenmaker, Wim and Schöps, Sebastian and Wieers, Aarnout (2016):
Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries.
In: DATE 2016, [Conference or Workshop Item]

Günther, Michael and Putek, Piotr and ter Maten, E. Jan W. and Pulch, Roland and Schoenmaker, Wim and Meuris, Peter and Wieers, Aarnout and Deleu, Frederik (2015):
Uncertainty Quantification in Electro-Thermal Coupled Problems based on a Power Transistor Device.
In: MATHMOD 2015 - 8th Vienna International Conference on Mathematical Modelling, [Conference or Workshop Item]

This list was generated on Sat Jun 6 01:53:03 2020 CEST.