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Uranium compounds prepared by sputter deposition: UFe2+x

Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2010)
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1)
doi: 10.1088/1742-6596/200/1/012057
Artikel, Bibliographie

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Kurzbeschreibung (Abstract)

UFe2 is one of rare examples of combination of 3d and 5f magnetism in a compound with relatively high TC = 162 K. U-excess is known to reduce the TC value markedly. To prepare the Laves phase with an Fe excess is much more difficult. It can be achieved by sputter deposition, but the structure becomes amorphous. TC can increase at least to 240 K (for UFe4), but the segregation of α-Fe cannot be avoided for very high Fe concentrations.

Typ des Eintrags: Artikel
Erschienen: 2010
Autor(en): Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G.
Art des Eintrags: Bibliographie
Titel: Uranium compounds prepared by sputter deposition: UFe2+x
Sprache: Englisch
Publikationsjahr: 2010
Verlag: IOP Publishing
Titel der Zeitschrift, Zeitung oder Schriftenreihe: Journal of Physics: Conference Series
Jahrgang/Volume einer Zeitschrift: 200
(Heft-)Nummer: 1
DOI: 10.1088/1742-6596/200/1/012057
URL / URN: http://iopscience.iop.org/1742-6596/200/1/012057/
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Kurzbeschreibung (Abstract):

UFe2 is one of rare examples of combination of 3d and 5f magnetism in a compound with relatively high TC = 162 K. U-excess is known to reduce the TC value markedly. To prepare the Laves phase with an Fe excess is much more difficult. It can be achieved by sputter deposition, but the structure becomes amorphous. TC can increase at least to 240 K (for UFe4), but the segregation of α-Fe cannot be avoided for very high Fe concentrations.

Freie Schlagworte: condensed matter, electrical, magnetic, optical, surfaces, interfaces, thin films
Fachbereich(e)/-gebiet(e): 11 Fachbereich Material- und Geowissenschaften
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft
11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Materialanalytik
Hinterlegungsdatum: 06 Dez 2010 12:48
Letzte Änderung: 13 Feb 2024 07:32
PPN:
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Sponsoren: This work was supported by the Grant Agency of the Academy of Sciences of the Czech Republic under the grant number IAA100100912 and by the Czech Research and Development project KAN101630651., N.-T.H.K-N and A.G.B. acknowledge the financial support from German Academic Exchange Service (DAAD)-project D/08/07991.
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