Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, IOP Publishing, pp. 012012, 303, (1), ISSN 1742-6596, [Online-Edition: http://dx.doi.org/10.1088/1742-6596/303/1/012012],
[Article]
Abstract
We have characterized UFe2+x films prepared by sputter deposition onto fused silica (SiO2) and Si(111) substrates with the film thickness ranging from 75 nm to 900 nm. The Xray diffraction results showed an amorphous character of the deposited material. Some of the films showed in addition a pattern of highly textured cubic Laves phase. Rutherford Backscattering Spectroscopy with 2 MeV He+ ions has been used to determine the composition, thickness and concentration depth profile of the films. A large ageing affect was observed within 1 month after that the films were exposed to air. Magnetic measurements revealed TC increasing with relative Fe concentration and reaching approx. 450 K in UFe3.0.
| Item Type: | Article |
|---|---|
| Erschienen: | 2011 |
| Creators: | Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. |
| Title: | Characterization of U-based thin films: the UFe2+xcase |
| Language: | English |
| Abstract: | We have characterized UFe2+x films prepared by sputter deposition onto fused silica (SiO2) and Si(111) substrates with the film thickness ranging from 75 nm to 900 nm. The Xray diffraction results showed an amorphous character of the deposited material. Some of the films showed in addition a pattern of highly textured cubic Laves phase. Rutherford Backscattering Spectroscopy with 2 MeV He+ ions has been used to determine the composition, thickness and concentration depth profile of the films. A large ageing affect was observed within 1 month after that the films were exposed to air. Magnetic measurements revealed TC increasing with relative Fe concentration and reaching approx. 450 K in UFe3.0. |
| Journal or Publication Title: | Journal of Physics: Conference Series |
| Volume: | 303 |
| Number: | 1 |
| Publisher: | IOP Publishing |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Material Analytics |
| Date Deposited: | 12 Dec 2012 12:23 |
| Official URL: | http://dx.doi.org/10.1088/1742-6596/303/1/012012 |
| Additional Information: | Joint European Magnetic Symposia – JEMS 2010 |
| Identification Number: | doi:10.1088/1742-6596/303/1/012012 |
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