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Number of items: 2.

Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
303, In: Journal of Physics: Conference Series, (1), IOP Publishing, pp. 012012, ISSN 1742-6596, [Online-Edition: http://dx.doi.org/10.1088/1742-6596/303/1/012012],
[Article]

Adamska, A. M. and Havela, L. and Danis, S. and Pesicka, J. and Macl, J. and Uhlirova, K. and Gouder, T. and Eloirdi, R. and Huber, F. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2010):
Uranium compounds prepared by sputter deposition: UFe2+x.
200, In: Journal of Physics: Conference Series, (1), IOP Publishing, pp. 012057, [Online-Edition: http://iopscience.iop.org/1742-6596/200/1/012057/],
[Article]

This list was generated on Sat Dec 7 01:15:27 2019 CET.