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Number of items: 4.

Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. :
Characterization of U-based thin films: the UFe2+xcase.
[Online-Edition: http://dx.doi.org/10.1088/1742-6596/303/1/012012]
In: Journal of Physics: Conference Series, 303 (1) 012012. ISSN 1742-6596
[Article] , (2011)

Adamska, A. M. and Havela, L. and Danis, S. and Pesicka, J. and Macl, J. and Uhlirova, K. and Gouder, T. and Eloirdi, R. and Huber, F. and Kim-Ngan, N.-T. H. and Balogh, A. G. :
Uranium compounds prepared by sputter deposition: UFe2+x.
[Online-Edition: http://iopscience.iop.org/1742-6596/200/1/012057/]
In: Journal of Physics: Conference Series, 200 (1) 012057.
[Article] , (2010)

Danis, S. and Javorsky, P. and Rafaja, David and Sechovsky, V. and Cuong, T. D. :
Crystal structure and transport phenomena in the Er(Co1-x X x)2, X=Ge, Si compounds studied at low temperatures.
In: Journal of alloys and compounds, 345 pp. 54-58.
[Article] , (2002)

Danis, S. and Javorsky, P. and Rafaja, David :
Magneto-crystalline anisotropy in TbPdIn, DyNiAl and GdNiAl studied by using x-ray powder diffraction at low temperatures.
In: Journal of alloys and compounds, 345 pp. 10-15.
[Article] , (2002)

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