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Number of items: 4.

Kim-Ngan, Nhu-T. H. ; Havela, L. ; Adamska, A. M. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Eloirdi, R. ; Huber, F. ; Gouder, T. ; Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1), pp. 012012. IOP Publishing, ISSN 1742-6596,
[Article]

Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2010):
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1), pp. 012057. IOP Publishing, [Article]

Danis, S. ; Javorsky, P. ; Rafaja, David (2002):
Magneto-crystalline anisotropy in TbPdIn, DyNiAl and GdNiAl studied by using x-ray powder diffraction at low temperatures.
In: Journal of alloys and compounds, 345, pp. 10-15. [Article]

Danis, S. ; Javorsky, P. ; Rafaja, David ; Sechovsky, V. ; Cuong, T. D. (2002):
Crystal structure and transport phenomena in the Er(Co1-x X x)2, X=Ge, Si compounds studied at low temperatures.
In: Journal of alloys and compounds, 345, pp. 54-58. [Article]

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