2009

Gigler, A. M. ; Huber, A. J. ; Bauer, M. ; Ziegler, A. ; Hillenbrand, R. ; Stark, R. W. (2009)
Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy.
In: Optics Express, 17 (25)
doi: 10.1364/OE.17.022351
Artikel, Bibliographie

1998

Ostrowski, Thomas ; Ziegler, A. ; Bordia, Rajendra K. ; Rödel, Jürgen (1998)
Evolution of Young's modulus, strength and microstructure during liquid phase sintering.
In: Journal of the American Ceramic Society, 81 (7)
Artikel, Bibliographie