Kim-Ngan, Nhu-T. H. ; Havela, L. ; Adamska, A. M. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Eloirdi, R. ; Huber, F. ; Gouder, T. ; Balogh, A. G. (2011)
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1)
doi: 10.1088/1742-6596/303/1/012012
Artikel, Bibliographie

Kim-Ngan, N.-T. H. ; Balogh, A. G. ; Havela, L. ; Gouder, T. (2010)
Ion beam mixing in uranium nitride thin films studied by Rutherford Backscattering Spectroscopy.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 268 (11-12)
Artikel, Bibliographie

Adamska, A. M. ; Havela, L. ; Danis, S. ; Pesicka, J. ; Macl, J. ; Uhlirova, K. ; Gouder, T. ; Eloirdi, R. ; Huber, F. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2010)
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1)
doi: 10.1088/1742-6596/200/1/012057
Artikel, Bibliographie