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Niu, G. and Schubert, M. A. and Sharath, S. U. and Zaumseil, P. and Vogel, S. and Wenger, C. and Hildebrandt, E. and Bhupathi, S. and Perez, E. and Alff, L. and Lehmann, M. and Schroeder, T. and Niermann, T. (2017):
Electron holography on HfO2/HfO2−x bilayer structures with multilevel resistive switching properties.
In: Nanotechnology, IOP Science Publishing, p. 215702, 28, (21), ISSN 0957-4484,
[Online-Edition: http://doi.org/10.1088/1361-6528/aa6cd9],
[Article]

Niu, G. and Schubert, M. A. and Sharath, S. U. and Zaumseil, P. and Vogel, S. and Wenger, C. and Hildebrandt, E. and Bhupathi, S. and Perez, E. and Alff, L. and Lehmann, M. and Schroeder, T. and Niermann, T. (2017):
Electron holography on HfO2/HfO2−xbilayer structures with multilevel resistive switching properties.
In: Nanotechnology, IOP Publishing, p. 215702, 28, (21), ISSN 0957-4484,
DOI: 10.1088/1361-6528/aa6cd9,
[Online-Edition: https://doi.org/10.1088/1361-6528/aa6cd9],
[Article]

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